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World Class Ellipsometer
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Thin film thickness and optical characterization
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Angstrom Advanced Inc. is a world renown ellipsometer manufacturer, bringing to the market the largest scope of ellipsometry instruments including Discrete Wavelength Ellipsometers and Spectroscopic Ellipsometers:
- Discrete Wavelength Ellipsometers (Single Wavelength Ellipsometers and Multi-wavelength Ellipsometers)
- Deep UV, UV, VIS, NIR and IR Spectroscopic Ellipsometers
Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). You can find Angstrom Advanced Ellipsometers in some of the most prestigious laboratories such as MIT, NASA, UC Berkeley, Yale University, Duke University, NIST and many more. Angstrom Advance's mission is to manufacture, supply and support the most accurate and stable ellipsometers on the market. Angstrom Advanced sets the standard in Ellipsometry. Many upgradable accessories are available for
different applications.
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PHE100 Spectroscopic Reflectometer
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Simple, accurate, reliable, affordable desktop or in-situ/on-line, R&D or production Thickness and optical constants (n and k) can be measured quickly and easily. The measurement and analysis of the data provides results in seconds. |
Ellipsometer Thickness Range: 20 nm to 50000 nm
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PHE101 Discrete Wavelength Ellipsometer
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The PHE101 is an ideal discrete wavelength ellipsometer designed for measuring the refractive index and thickness of single and multi-layer films. The PHE101 ellipsometer takes quick and accurate readings due to its precision optical analyzer/detector and its stable mechanical design. |
Ellipsometer Thickness Range: 0 - 6000 nm
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PhE101S Variable Angle Discrete Wavelength Ellipsometer
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Model PhE101S Ellipsometer is an ideal instrument for antireflective coatings on Silicon Solar Cells.The PhE101S ellipsometer has patented Minsearch technique-which stops the motor at a defined position before the intensity value is measured from the detector. |
Ellipsometer Thickness Range: 0 - 6000 nm
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PHE101M Multi-Wavelength Discrete Ellipsometer
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The PHE101M is a multi-wavelength ellipsometer. Different wavelengths from UV, VIS or NIR range (up to 5 wavelengths)can be selected. The PHE101M ellipsometer has all of the features which PHE101 has. The PHE101M ellipsometer takes quick and accurate readings due to its precision optical analyzer/detector and its stable mechanical design. |
Ellipsometer Thickness Range: 0 - 6000 nm
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PHE102 Spectroscopic Ellipsometer
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The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250 - 1100nm, 250-1700nm or 250-2100nm. In the PHE-102 Ellipsometer a broad band white light source is used to illuminate the sample spot. |
Ellipsometer Thickness Range: 0 - 30000 nm
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PHE103 UV/VIS NIR Spectroscopic Ellipsometer
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The PHE-103 Ellipsometer is a new model which adds the Transmission and Variable Angle Reflection function. This variable angle spectroscopic ellipsometer operates in the spectral range 250 - 1100nm or 250-1700nm or 250-2100nm, a broad band white light source to illuminate the sample spot. |
Ellipsometer Thickness Range: 0 - 30000 nm
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PHE 104 Infrared Spectroscopic Ellipsometer
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NS-IRSE infrared spectroscopic ellipsometer is a unique infrared spectroscopic ellipsometer instrument based on monochromator-dispersion. It features highest accuracy, precision and is more economical compared to FT-IR spectrometer. |
Ellipsometer Spectral Range: nominal MIR:400 cm-1 ~ 4000 cm-1
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Accessories for PHE series Ellipsometers
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Angstrom Advanced Inc offers a full line of Ellipsometer accessories including:
Ellipsometry Wafer Mapping & Motorized X-Y Sample Stage,Automated Angle of Incidence, Micro Spot, Liquid Cell, Heater, CCD Image Camera and many others.
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