Discrete Wavelength Ellipsometer & Spectroscopic Ellipsometer - Product Line

Products

Angstrom Advanced Ellipsometers

	PhE100 Spectroscopic Reflectometer Simple, accurate, reliable, affordable desktop or in-situ/on-line, R&D or production Thickness and optical constants (n and k) can be measured quickly and easily. The measurement and analysis of the data provides results in seconds. Ellipsometer Thickness Range: 20 nm to 50 Î¼m
	PhE101 Discrete Wavelength Ellipsometer The PHE101 is an ideal discrete wavelength ellipsometer designed for measuring the refractive index and thickness of single and multi-layer films. The PHE101 ellipsometer takes quick and accurate readings due to its precision optical analyzer/detector and its stable mechanical design. Ellipsometer Thickness Range: 0 - 6000 nm
	PhE101M Discrete Wavelength Ellipsometer The PHE101M is a multi-wavelength ellipsometer. Different wavelengths from UV, VIS or NIR range (up to 5 wavelengths)can be selected. The PHE101M ellipsometer has all of the features which PHE101 has. The PHE101M ellipsometer takes quick and accurate readings due to its precision optical analyzer/detector and its stable mechanical design. Ellipsometer Thickness Range: 0 - 6000 nm
	PhE101S Variable Angle Discrete Wavelength Ellipsometer Model PhE101S Ellipsometer is an ideal instrument for antireflective coatings on Silicon Solar Cells.The PhE101S ellipsometer has patented Minsearch technique-which stops the motor at a defined position before the intensity value is measured from the detector. Ellipsometer Thickness Range: 0 - 6000 nm
	PhE102 Spectroscopic Ellipsometer The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250 - 1100nm, 250-1700nm or 250-2100nm. In the PHE-102 Ellipsometer a broad band white light source is used to illuminate the sample spot. Ellipsometer Thickness Range: 0 - 30000 nm
	PhE103 Spectroscopic Ellipsometer The PHE-103 Ellipsometer is a new model which adds the Transmission and Variable Angle Reflection function. This variable angle spectroscopic ellipsometer operates in the spectral range 250 - 1100nm or 250-1700nm or 250-2100nm, a broad band white light source to illuminate the sample spot. Ellipsometer Thickness Range: 0 - 30000 nm
	PhE104 Infrared Spectroscopic Ellipsometer NS-IRSE infrared spectroscopic ellipsometer is a unique infrared spectroscopic ellipsometer instrument based on monochromator-dispersion. It features highest accuracy, precision and is more economical compared to FT-IR spectrometer. Ellipsometer Spectral Range: nominal MIR:400 cm-1 ~ 4000 cm-1
	Optional Accessories for PHE series Ellipsometers

* The image of each model is to be modified time by time.